DFT Study Of Nitrogen-Doped Silicon: Analysis Of Structural Distortion, Electronic Properties And Formation Energy. International Journal of Environmental Sciences, [S. l.], p. 597–602, 2025. DOI: 10.64252/7ypetp32. Disponível em: https://theaspd.com/index.php/ijes/article/view/6461.. Acesso em: 12 oct. 2025.